CVD thin film deposition (Si₃N₄ SiO₂)
SiO2 Process
| Process Gases | SiH4-N2-N2THE |
| Deposition Temperature | >300ºC |
| Clean Gases | CF4-N2THE |
| Wafer Size/Batch size | up to 200mm |
| Deposition rate | > 40nm/min |
| Film Thickness Uniformity within-wafer |
|
| Wafer to wafer repeatability |
|
| Refractive Index (measured at 632.8nm) | 1.46 (controllable 1.46~1.50) |
| RI Uniformity |
|
| RI Repeatability |
|
| Film Stress |
|
SiNx Process
| Process Gases | SiH4-N2-NH3 |
| Deposition Temperature | >300ºC |
| Clean Gases | CF4-N2THE |
| Wafer Size | up to 200mm |
| Deposition rate | > 10nm/min |
| Film Thickness Uniformity within-wafer |
|
| Wafer to wafer repeatability |
|
| Refractive Index (measured at 632.8nm) | 1.98 (controllable 1.98~2.01) |
| RI Uniformity |
|
| RI Repeatability |
|
| Film Stress |
|
MEMS Advanced Manufacturing
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