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CVD thin film deposition (Si₃N₄ SiO₂)
MEMS Advanced Manufacturing

CVD thin film deposition (Si₃N₄ SiO₂)

PECVD Oxford PlasmaPro 100

Specifically designed for producing high-speed thin films with excellent uniformity, our plasma cleaning process allows for control over film properties such as refractive index, stress, electrical properties, and wet chemical etching rate. Our process features endpoint control, eliminating or reducing the need for physical/chemical chamber cleaning.

High-quality silicon nitride and silicon dioxide PECVD for optoelectronics, dielectric layers, passivation, and many other applications.

High-quality SiO for a variety of applicationsx, SiNxand SiOxNandsediment

8-inch SiOx Film formation

8-inch SiNx Film formation

    SiO2 Process

    Process Gases

    SiH4-N2-N2THE

    Deposition Temperature

    >300ºC

    Clean Gases

    CF4-N2THE

    Wafer Size/Batch size

    up to 200mm

    Deposition rate

    > 40nm/min

    Film Thickness Uniformity within-wafer

    Wafer to wafer repeatability

    Refractive Index (measured at 632.8nm)

    1.46 (controllable 1.46~1.50)

    RI Uniformity

    RI Repeatability

    Film Stress

    SiNx Process

    Process Gases

    SiH4-N2-NH3

    Deposition Temperature

    >300ºC

    Clean Gases

    CF4-N2THE

    Wafer Size

    up to 200mm

    Deposition rate

    > 10nm/min

    Film Thickness Uniformity within-wafer

    Wafer to wafer repeatability

    Refractive Index (measured at 632.8nm)

    1.98 (controllable 1.98~2.01)

    RI Uniformity

    RI Repeatability

    Film Stress

    MEMS Advanced Manufacturing

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