ICP plasma etching beam etching
index
| Process Reference | 1 | 2 | 3 | 4 |
| Etched Material | PZT¹ | Pt¹ | Al²,³ | AlN |
| Gas chemistry | Ar-CHF₃-(Cl₂) | Ar-Cl₂ | BCl₃-Cl₂ | BCl₃-Cl₂-Ar |
| Etch Depth / μm | ≤ 2.0 | ≤ 0.2 | ≤ 2.0 | ≤ 2.0 |
| Etch rate / nm/min | >100 | >100 | >200 | >150 |
| Mask type | PR | PR | PR | PR |
| Selectivity | >0.7:1(PR) >10:1 (Pt) | >0.5:1 (PR) | 2:1 (PR) | >0.7:1 (PR) >0.5 to 2:1 (Mo)⁴ |
| Profile / ° | >70 | >70 | >88 | >70 |
| Uniformity (within wafer) |
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| Run-to-run |
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MEMS Advanced Manufacturing
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